Die identification by optically reading selectively blowable fuse elements

An integrated circuit, comprising:

• integrated functional circuitry;
• an array of fuse elements, each fuse element having a first terminal and a second terminal, wherein the first terminals are directly connected to a fuse sensing node;
• a first switch actuated by a first control signal to apply a programming voltage to the fuse sensing node;
• a second switch actuated by a second control signal to apply a reading current to the fuse sensing node;
• and
• a demultiplexing circuit comprising:
• a switching circuit connected in series with each fuse element within the array of fuse elements at the second terminal;
• and
• a decoder circuit configured to:
• selectively actuate the switching circuits in a first mode when the first control signal actuates the first switch and the second switch is deactuated so as to cause the programming voltage to be applied at the fuse sensing node and across selected ones of the fuse elements within the array of fuse elements which is sufficient to blow the selected fuse element so as to program individual fuse elements within the array of fuse elements with data bits defining a die identification that specifies a location of the integrated circuit die on a wafer from which the integrated circuit die was singulated;
• and
• selectively actuate the switching circuits in a second mode when the second control signal actuates the second switch and the first switch is deactuated so as to cause the reading current to be applied at the fuse sensing node and across the fuse elements within the array of fuse elements to generate an output signal at the fuse sensing node indicating whether the fuse element is blown so as to read the data bits defining the die identification.