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US 10,483,126 B2Granted
Semiconductor manufacturing apparatus and manufacturing method of semiconductor device
AssigneeToshiba Memory Corporation
InventorsTakashi Izumi, Fumitoshi Ikegaya
Life of this patent
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Abstract
A semiconductor manufacturing apparatus according to the present embodiment has a mount unit capable of mounting a substrate. A first supplier supplies a chemical solution onto the substrate. A first protection plate is provided along an outer circumference of the substrate, to receive the chemical solution splashing from the substrate. A second supplier is provided above the first protection plate, to supply a cleaning solution to an inner surface of the first protection plate.
Claims1
A semiconductor manufacturing apparatus comprising:
- a stage capable of mounting a substrate;
- a first nozzle supplying a chemical solution onto the substrate;
- a first protection plate provided along an outer circumference of the substrate, the first protection plate receiving the chemical solution splashing from the substrate;
- a second nozzle provided above the first protection plate, the second nozzle supplying pure water to an inner surface of the first protection plate;
- a second protection plate provided at an outside of the first protection plate, the second protection plate receiving the chemical solution splashing from the substrate;
- a third nozzle provided above the second protection plate, the third nozzle supplying pure water to an inner surface of the second protection plate;
- and
- a sucker sucking the chemical solution supplied onto the substrate, wherein
- an angle of inclination of the inner surface of the first protection plate is zero to 45 degrees with respect to an almost vertical direction,
- the inner surface of the first protection plate is hydrophilic so that a contact angle between the inner surface of the first protection plate and pure water is less than 90 degrees,
- the second nozzle is a pipe provided along an upper edge part of the first protection plate, the pipe comprising a plurality of first holes,
- the first holes are provided to the second nozzle at an inner surface side of the first protection plate,
- the third nozzle is a pipe provided along an upper edge part of the second protection plate, the pipe comprising a plurality of second holes,
- the second holes are provided to the third nozzle at an inner surface side of the second protection plate, and
- the stage rotates the substrate while the chemical solution or the pure water is supplied on the substrate.
12 more elements
Dependencies are inferred from the claim text.