Dynamic diagnostics analysis for memory built-in self-test
OwnerSteven Lee Gregor, Puneet Arora +1inventors
InventorsSteven Lee Gregor, Puneet Arora, Norman Robert Card
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Abstract
Systems and methods disclosed herein provide for improved diagnostics for memory built-in self-test (“MBIST”). Embodiments provide for a two-pass diagnostic test of the target memory, wherein, in the first pass, a data compare unit provides clock cycle values associated with detected mis-compares to a tester, and, in the second pass, the data compare unit extracts data vectors associated with the clock cycle values. Embodiments further provide for a bit fail map report that is generated based on the extracted data vectors.
Claims20
A memory built-in self-test (“MBIST”) diagnostics system, comprising:
- a memory, wherein the memory is tested with an algorithm for a plurality of passes;
- a data compare unit;
- a tester;
- and
- a processor, wherein:
- during a first pass of the test, the data compare unit is configured to provide, to the tester, a clock cycle associated with a word of the memory including at least one mis-compare,
- during at least a second pass of the test, the data compare unit is further configured to (i) extract contents of the word based on the corresponding clock cycle and (ii) provide the extracted contents of the word to the tester, and
- the processor is configured to generate a bit fail map report based on the extracted contents of the word, wherein the bit fail map report includes information associated with the at least one mis-compare.
A diagnostics method for memory built-in self-test (“MBIST”), the method comprising:
- testing a memory with an algorithm for a plurality of passes, wherein:
- during a first pass of the test:
- providing, with a data compare unit, a clock cycle associated with a word of the memory including at least one mis-compare to a tester,
- during at least a second pass of the test:
- extracting, with the data compare unit, contents of the word based on the corresponding clock cycle, and
- providing, with the data compare unit, the extracted contents of the word to the tester;
- and
- generating, with a processor, a bit fail map report based on the extracted contents of the word, wherein the bit fail map report includes information associated with the at least one mis-compare.
Dependencies are inferred from the claim text.