Efficient testing of direct memory address translation
AssigneeInternational Business Machines Corporation
InventorsManoj Dusanapudi, Shakti Kapoor, Nelson Wu
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AssigneeInternational Business Machines Corporation
InventorsManoj Dusanapudi, Shakti Kapoor, Nelson Wu
Estimating the term…
A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.
A computer-implemented method of testing an integrated circuit, the method comprising:
A computer-implemented method of testing a link processing unit on an integrated circuit, the method comprising:
A computer-implemented method of testing an integrated circuit, the method comprising:
Dependencies are inferred from the claim text.