Method and system for automatically mapping fluid objects on a substrate

A method for mapping objects on a substrate using a microscope inspection system comprising:

• providing a microscope inspection system comprising a microscope system and a computer analysis system,
• wherein the microscope system includes a light source, imaging device, stage for moving a substrate disposed on the stage, and a control module, and
• wherein the computer analysis system includes an object identification module and an object layout prediction module;
• and
• performing a scan of the substrate using the microscope inspection system;
• identifying for each of the objects on the substrate, an object position on the substrate including a set of X, Y, and θ coordinates using algorithms, machines and systems including artificial intelligence and image processing algorithms,
• wherein at least one of the objects is fluid and has shifted from a prior position or deformed from a prior size, and wherein the fluid object includes electronic objects on a substrate or biological objects such as cells, tissue or the like found in a biological specimen mounted on a slide;
• and
• generating, by the computer analysis system, object mapping information that reflects the position of each of the objects and a shift or deformity amount for the at least one of the objects with respect to the prior position or the prior size of the at least one of the objects based on an identification of the prior position or the prior size of the at least one of the objects,
• wherein the step of generating object mapping information is done automatically using algorithms, machines and systems including artificial intelligence and image processing algorithms.

A system for mapping fluid objects on a substrate comprising:

• a microscope inspection system including a microscope system,
• wherein the microscope system includes a light source, imaging device, stage for moving a substrate disposed on the stage, and a control module, and
• wherein the imaging device scans the substrate;
• an object layout identification module for identifying for each of the objects on the substrate, an object position on the substrate including a set of X, Y, and θ coordinates using algorithms, machines and systems including artificial intelligence and image processing algorithms,
• wherein at least one of the objects is fluid and at least one of the objects has shifted from a prior position or deformed from a prior size, and wherein the fluid object includes electronic objects on a substrate or biological objects such as cells, tissue or the like found in a biological specimen mounted on a slide;
• and
• wherein the object layout identification module generates object mapping information that reflects the position of each of the objects and a shift or deformity amount for the at least one of the objects with respect to the prior position or the prior size of the at least one of the objects based on an identification of the prior position or the prior size of the at least one of the objects.