Systems and methods for determination of depth of interaction

A method of imaging using a semiconductor detector having a surface with plural pixelated anodes disposed thereon, wherein each pixelated anode is configured to generate a primary signal responsive to reception of a photon by the pixelated anode and to generate at least one secondary signal responsive to an induced charge caused by reception of a photon by at least one surrounding anode, the method comprising:

• acquiring a primary signal from one of the anodes responsive to reception of a photon by the one of the anodes;
• acquiring at least one secondary signal from at least one neighboring pixel of the one of the anodes responsive to an induced charge caused by the reception of the photon by the one of the anodes, the at least one secondary signal defining a plot of energy against detector depth, wherein at least a portion of the plot has a negative value;
• and
• determining a depth of interaction in the semiconductor detector for the reception of the photon by the one of the anodes using the negative value of the at least one secondary signal.

A method of providing a radiation detector assembly comprising:

• providing a semiconductor detector having a surface with plural pixelated anodes disposed thereon, each pixelated anode configured to generate a primary signal responsive to reception of a photon by the pixelated anode and to generate at least one secondary signal responsive to an induced charge caused by reception of a photon by at least one adjacent anode;
• operably coupling the pixelated anodes to at least one processor,
• providing a calibrated radiation supply at different depths along a sidewall of the semiconductor detector, wherein the pixelated anodes generate primary signals and secondary signals responsive to the calibrated radiation supply, the secondary signals defining corresponding plots of energy against detector depth, wherein at least a portion of the plots have negative values;
• acquiring, with the at least one processor, the primary signals and the secondary signals from the pixelated anodes;
• determining the corresponding negative values of total induced charges for each of the different depths;
• determining calibration information based on the negative values of the total induced charges for each of the different depths.