US 10,481,204 B2 · Methods and systems to measure a signal on an integrated circuit die

Abstract

Methods and systems to measure a signal on an integrated circuit die. An on-die measurement circuit may measure an on-die signal relative to an off-die generated reference signal, which may include a series of increasing voltage steps. The on-die measurement circuit may continuously compare voltages of the on-die signal and the off-die generated reference signal, and may generate an indication when the off-die reference signal exceeds the on-die signal. The measurement circuit may generate the indication from a voltage source other than the on-die signal to be measured, and/or may generate the indication with a relatively large voltage swing. The indication may be output off-die for evaluation, such as for testing, debugging, characterization, and/or operational monitoring. A unity gain analog buffer may be provided to tap the on-die signal proximate to a node of interest, which may be implemented within the on-die measurement circuit.

Claims17

Dependent claims

A processor comprising:

a first pad;
a second pad;
and
a measurement circuit having:
a first input node to receive a test signal;
a second input node to receive an adjustable reference signal from the first pad;
and
an output node to provide an indication of a relation between the test signal and the reference signal to the second pad,
wherein the measurement circuit is to protect the first input node from the second pad to preserve signal fidelity of the test signal;
and
a multiplexer coupled to the measurement circuit, wherein the multiplexer is to selectively provide an output from multiple measurement circuits including the measurement circuit.

8 more elements

Dependencies are inferred from the claim text.

Methods and systems to measure a signal on an integrated circuit die

Life of this patent

Methods and systems to measure a signal on an integrated circuit die

Life of this patent

Abstract

Claims17