Stationary bath for testing electronic components
AssigneeTexas Instruments Incorporated
InventorsDavid Wayne Kaase, Joseph Milton Yehle, James Henry McGee, Jr., Clemon Howell
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AssigneeTexas Instruments Incorporated
InventorsDavid Wayne Kaase, Joseph Milton Yehle, James Henry McGee, Jr., Clemon Howell
Estimating the term…
A system and method for stress-testing of electronic components are disclosed. The system and method include a stationary bath including a tub that defines an aperture in a plane, in which a plurality of slots are positionable and defined inside the tub and oriented orthogonally with respect to the plane. A dielectric fluid in the tub is heated by a heating element to a predetermined temperature value. A board is configured to be retrievably placed with one of the plurality of slots, the board having a plurality of sockets operable to receive corresponding electronic components.
A system, comprising:
A method, comprising:
A method, comprising:
Dependencies are inferred from the claim text.