Automated high frequency test station

A test station comprising:

• a test platform including a plurality of probes configured for electrical connection to a design under test;
• a radio frequency switch configured to receive at least first and second signals at first and second frequencies, the first and second frequencies being different from each other;
• an amplifier positioned and electrically connected to one or more of the plurality of probes, the amplifier configured to receive the selected signal from the radio frequency switch and output a test signal, the test signal corresponding to an amplified selected signal;
• a second amplifier positioned and electrically connected to one or more of the plurality of probes, the second amplifier configured to receive a result signal passed through the design under test;
• a programmable attenuator connected to an output of the second amplifier and having configurable attenuation levels;
• a power sensor electrically connected to receive a scaled result signal from the programmable attenuator based on the result signal and generate a sensed power output signal;
• a control circuit communicatively connected to the radio frequency switch, amplifier, second amplifier, and power sensor, the control circuit configured to execute instructions to selectively apply the first and second frequencies as the test signal to the one or more of the plurality of probes, thereby applying a test signal at each of the first and second frequencies to the design under test, wherein the design under test comprises an electrical connector subassembly, the control circuit further configured to determine the existence of a faulty product incorporating the design under test based on the sensed power output signal.