Multiple-pin-injection for lightning test

A method for performing a lightning multiple pin injection test on an equipment under test (EUT), comprising:

• determining a test scenario, wherein computer readable program instructions stored in a non-transitory computer-readable storage medium executable by at least one processor determines the test scenario to be tested to the EUT by the program instructions stored therein;
• determining test signal requirements based on the test scenario;
• determining a source impedance of a signal generator;
• providing a plurality of impedance-balancing elements at positions between the signal generator and the EUT;
• generating test input signals using the impedance-balancing elements;
• and
• testing the EUT by injecting the test input signals to corresponding pins of the EUT, respectively,
• wherein providing the impedance-balancing elements comprises:
• commonly connecting respective first ends of the impedance-balancing elements to an output node of a signal generator;
• and connecting respective second ends of the impedance-balancing elements to the corresponding pins, respectively when testing the EUT begins,
• wherein impedances of the impedance-balancing elements are independent of load impedance characteristics of the EUT, and
• wherein the computer readable program instructions stored in the non-transitory computer-readable storage medium executable by at least one processor are configured to adjust the impedances of the impedance-balancing elements such that respective test input signals output through the impedance-balancing elements meet the test signal requirements determined based on the test scenario.

A computer program product stored in a non-transitory computer-readable storage medium having computer readable program instructions, the computer readable program instructions executable by at least one processor to cause the at least one processor to perform a method for operating a test system of testing a lightning multiple pin injection on an equipment under test (EUT), wherein the test system comprises a signal generator generating a source signal and a plurality of impedance-balancing elements connected in parallel between the signal generator and the EUT,

• wherein the method comprises:
• determining a test scenario;
• determining test signal requirements based on the test scenario;
• determining a source impedance of the signal generator;
• determining impedances of the impedance-balancing elements;
• and
• adjusting impedances of the impedance-balancing elements based on the determined impedances, wherein the computer readable program instructions further causes the at least one processor to configure to adjust the impedances of the impedance-balancing elements such that respective test input signals output through the impedance-balancing elements meet the test signal requirements determined based on the test scenario,
• wherein the impedances of the impedance-balancing elements are independent of load impedance characteristics of the EUT.