Superconducting scanning sensor for nanometer scale temperature imaging

A sensor device comprising:

• a probe carrying a non-invasive thermal sensor, the probe comprising:
• a support structure configured to be carried by connection to a near end thereof and carrying a superconductive cap attached to a far end thereof, and
• at least two elongated superconductive leads connected to the superconductive cap at a far end thereof and providing corresponding electrically conductive ports at near end to thereby allow current transmission to the cap;
• wherein the superconductive cap has a first critical current value and the superconductive leads have a second critical current value higher than the first critical current value.

A system comprising:

• a scanning unit carrying a sensor probe,
• the scanning unit configured to selectively move the probe along a surface of a sample,
• the sensor probe comprising an elongated support structure carried on a near end thereof by the scanning unit and carrying an electrically conductive cap on a far end thereof;
• and
• at least two elongated conductive leads electrically connected to the cap,
• wherein the electrically conductive cap and the at least two elongated conductive leads define a path for transmission of electric current through the cap;
• wherein the sensor probe is configured for thermal measurements of the surface of the sample;
• and
• wherein the electrically conductive cap and elongated conductive leads are of a selected material composition such that they are in a superconductive state at a predetermined condition.