Back to results
US 10,481,108 B2Granted
System for defect indication detection
AssigneeGeneral Electric Company
InventorsAndrew Frank Ferro, Xingwei Yang, Paulo Ricardo dos Santos Mendonca, Christopher Allen Nafis, Patrick Joseph Howard
Life of this patent
Estimating the term…
Abstract
Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.
Claims20
A system for notifying a user of a potential defect in a composite part, comprising:
- one or more processors;
- memory operably coupled to the one or more processors, the memory containing instructions that, in response to execution of the instructions by the one or more processors, cause the one or more processors to:
- import data from a VCT acquisition apparatus over one or more computer networks, the data representing a plurality of associated parts;
- segment a subset of data from the imported data, the subset representing an individual part of the plurality of associated parts;
- perform assisted defect recognition to identify and classify indications of potential defects in the subset of data;
- and
- report the indications of identified and classified potential defects to an operator.
4 more elements
A system for notifying a user of a potential defect in a composite part, comprising:
- one or more processors;
- memory operably coupled to the one or more processors, the memory containing instructions that, in response to execution of the instructions by the one or more processors, cause the one or more processors to:
- import data from a VCT acquisition apparatus over one or more computer networks, the data representing a plurality of associated parts;
- segment a subset of data from the imported data, the subset representing an individual part of the plurality of associated parts;
- perform assisted defect recognition to identify and classify indications of potential defects in the subset of data, wherein assisted defect recognition includes normalization of the subset of data against a generated background volume of the individual part that includes scattering or beam hardening artifacts;
- and
- report the indications of identified and classified potential defects to an operator.
4 more elements
Dependencies are inferred from the claim text.