Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method

A measurement processing method, comprising:

• acquiring a first sliced region that is a part of a specimen, as first sliced region information, by using X-rays;
• and
• identifying a position of the first sliced region in the specimen by using the first sliced region information and shape information of the specimen.

A measurement processing method, the measurement processing method comprising:

• acquiring first sliced region information related to a first sliced region that is a part of a specimen, by using X-rays;
• and
• identifying a position of the first sliced region in the specimen, based on the first sliced region information and the shape information of the specimen for identifying a position of the first sliced region in the specimen.