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US 10,481,089 B2Granted
Optical detection system with tilted sensor
AssigneeIntegrated Plasmonics Corporation
InventorRobert Joseph Walters
Life of this patent
Estimating the term…
Abstract
A detection system includes a planar plasmonic element for analyzing an analyte, the plasmonic element having dielectric and metallic regions, the plasmonic element emitting light that carries detected information; and a planar two-dimensional image sensor positioned in non-parallel angled relationship with respect to a plane of the plasmonic element to enhance a spatial image resolution for the light that carries detected information with respect to at least a portion of the light.
Claims3
A detection system comprising:
- a planar plasmonic element for analyzing an analyte, the plasmonic element having dielectric and metallic regions, the plasmonic element emitting light that carries detected information, said light having an optical axis along which said light propagates, said optical axis being perpendicular to a plane of the planar plasmonic element;
- and
- a planar two-dimensional image sensor positioned in non-parallel angled relationship with respect to a plane perpendicular to said optical axis of said light that enters the planar two-dimensional image sensor so as to enhance a spatial image resolution for said light that carries detected information with respect to at least a portion of said light,
- wherein the planar two-dimensional image sensor is a CMOS sensor and is positioned directly below the planar plasmonic element without any other intervening optical elements between the planar plasmonic element and the CMOS sensor.
1 more element
A device for detecting an analyte, comprising:
- a light source emitting substantially monochromatic light;
- a two-dimensional diffraction element that interacts with the light from the light source, the diffraction element having one or more features that can generate plasmon waves upon receipt of the light from the light source, at least some of the features being configured to interact with the analyte so as to emit detection light that carries detected information, said detection light having an optical axis along which said detection light propagates, said optical axis being perpendicular to a plane of the two-dimensional diffraction element;
- and
- a two-dimensional image sensor facing the diffraction element at an angle to receive diffracted light from the diffraction element so as to detect a diffraction pattern projected thereto, the two-dimensional image sensor being disposed in a direction angularly offset from a plane perpendicular to said optical axis of said detection light that enters the two-dimensional image sensor,
- wherein the two-dimensional image sensor is a CMOS sensor and is positioned directly below the two-dimensional diffraction element without any other intervening optical elements between the two-dimensional diffraction element and the CMOS sensor.
2 more elements
Dependencies are inferred from the claim text.