Back to results
US 10,481,053 B2Granted
Method for detecting defects of glass substrates
AssigneeSamsung Display Co., Ltd.
InventorsCheol Min Park, Jeong Woo Park, Seung Kim, Seung Ho Kim, Hoi Kwan Lee, Woo Jin Cho, Hee Kyun Shin, Hyun Joon Oh
Life of this patent
Estimating the term…
Abstract
A method of detecting defects of a glass substrate includes cutting a glass mother substrate into a plurality of glass substrates, penetrating ions into an incision surface of the glass substrate to visualize defects of the incision surface, and photographing the defects of the incision surface to determine a bending strength of the glass substrate based on a size of the defects.
Claims10
A method for detecting defects of a glass substrate, the method comprising:
- cutting a glass mother substrate into a plurality of glass substrates and making incision surfaces to the plurality of glass substrates which are side surfaces of the plurality of glass substrates;
- penetrating ions into the incision surfaces of the plurality of glass substrates in perpendicular directions to the incision surfaces to visualize a defect of the incision surfaces;
- and
- photographing the defect of the incision surfaces to determine a bending strength of the glass substrate based on a size of the defect.
1 more element
Dependencies are inferred from the claim text.