Light wavelength measurement method and light wavelength measurement apparatus
AssigneeOsaka University
InventorsTsuyoshi Konishi, Takema Satoh, Tomotaka Nagashima
Life of this patent
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Abstract
A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light; and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale.
Claims2
A spectrum measurement method of measuring a spectrum of input light, the spectrum measurement method comprising:
- receiving the input light on a dispersion device that separates the input light into a plurality of beams having a predetermined interval, and disperses each beam of the plurality of beams in accordance with a wavelength of the beam;
- causing the plurality of beams output from the dispersion device to overlap a main-scale device having graduations to allow at least part of the plurality of beams to pass through the main-scale device, wherein an interval of the graduations is different from the predetermined interval;
- and
- measuring the spectrum of the input light by measuring, using an image sensor arranged separately from the main-scale device, an intensity distribution of the at least part of the plurality of beams having passed through the main-scale device.
A spectrum measurement apparatus that measures a spectrum of input light, the spectrum measurement apparatus comprising:
- a dispersion device that separates the input light into a plurality of beams having a predetermined interval, and disperses each beam of the plurality of beams in accordance with a wavelength of the beam;
- a main-scale device having graduations, the main-scale device configured to allow at least part of the plurality of beams to pass through the main-scale device, and an interval of the graduations is different from the predetermined interval;
- and
- an image sensor that is arranged separately from the main-scale device, and measures the spectrum of the input light by measuring an intensity distribution of the at least part of the plurality of beams having passed through the main-scale device.
Dependencies are inferred from the claim text.