Systems and methods for noise and drift calibration using dithered calibration

A method for providing low-noise and low-bias measurements, the method comprising:

• mounting two or more dithered calibrated sensors within a package;
• coupling the two or more dithered calibrated sensors to a processing unit, wherein the dithered calibrated sensors provide directional measurements to the processing unit;
• dithering each dithered calibrated sensors in the two or more dithered calibrated sensors rotationally about a rotation axis such that each dithered calibrated sensor provides a low-noise measurement along a first axis and a zero-bias measurement along a second axis, wherein the second axis is orthogonal to the first axis, wherein the first axis of a first dithered calibrated sensor in the two or more dithered calibrated sensors is aligned with the second axis of a second dithered calibrated sensor in the two or more dithered calibrated sensors;
• and
• processing the measurements from the two or more dithered calibrated sensors such that low-noise and zero-bias measurements are produced for the axes measured by the two or more dithered calibrated sensors, wherein a low-noise and zero-bias measurement is produced by combining the low-noise measurement from the first dithered calibrated sensor with the zero-bias measurement from the second dithered calibrated sensor.

A sensor assembly, the sensor assembly comprising:

• two or more dithered calibrated sensors that provide directional measurements to a processing unit, wherein a dithered calibrated sensor in the two or more dithered calibrated sensors has an input axis that rotates about an axis such that bias error can be removed by the processing unit;
• wherein the two or more dithered calibrated sensors are arranged with respect to each other such that a low-noise measurement axis of a first dithered calibrated sensor in the two or more dithered calibrated sensors is aligned with a zero-bias measurement axis of a second dithered calibrated sensor in the two or more dithered calibrated sensors;
• and
• wherein the processing unit executes an algorithm to combine measurements produced by the two or more dithered calibrated sensors that are along the same axis to produce a measurement for each measured axis that has both low-noise and zero-bias, wherein the measurement is produced by combining a low-noise measurement by the first dithered calibrated sensor along the low-noise measurement axis and the zero-bias measurement by the second dithered calibrated sensor along the zero-bias measurement axis.