Oxynitride thin film and capacitance element
AssigneeTDK Corporation
InventorsTakeshi Shibahara, Yuki Nagamine, Kumiko Yamazaki
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AssigneeTDK Corporation
InventorsTakeshi Shibahara, Yuki Nagamine, Kumiko Yamazaki
Estimating the term…
A dielectric thin film has a main component including an oxynitride having excellent dielectric property, and a capacitance element includes the dielectric thin film. The dielectric thin film has a main component made of an oxynitride expressed by a compositional formula of AaBbOoNn (a+b+o+n=5), wherein “A” is one or more selected from Sr, Ba, Ca, La, Ce, Pr, Nd, and Na, “B” is one or more selected from Ta, Nb, Ti, and W, and crystalline particles constituting the dielectric thin film are polycrystalline which are not oriented to a particular crystal plane orientation, and further the crystalline particles have columnar shape crystals.
A capacitance element comprising a dielectric thin film comprising a main component comprised of an oxynitride expressed by a compositional formula of AaBbOoNn (a+b+o+n=5),
Dependencies are inferred from the claim text.