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US 10,478,860 B2Granted
Device and method for the flexible classification of polycrystalline silicon fragments
AssigneeWacker Chemie AG
InventorsMarcus Schaefer, Reiner Pech
Life of this patent
Estimating the term…
Abstract
Polycrystalline silicon fragments are sorted into defined particle fractions in a flexible manner independent of initial particle size distribution and desired fraction size by a first mechanical screening into a fine fraction and residual fraction, followed by optoelectronic sorting of the residual fraction.
Claims23
A device for the classification of crushed polysilicon fragments comprising:
- a) a mechanical screening system comprising at least one screen having fine holes which removes fine polysilicon fragments from the screen through the holes and leaves a residual polysilicon component,
- b) an optoelectronic sorting system which classifies the residual polysilicon component into a plurality of fractions of different sizes.
A method for the flexible classification of crushed polysilicon comprising:
- first classifying the crushed polysilicon with a mechanical screening system comprising at least one screen having fine holes, removing fine polysilicon fragments through the holes, and leaving a residual polysilicon component on the mechanical screening system;
- and
- classifying the residual polysilicon component from the mechanical screening system into a plurality of fractions of different fragment sizes by an optoelectronic sorting system.
Dependencies are inferred from the claim text.