Systems and methods for X-ray imaging

A method, comprising:

• emitting an electron beam from a cathode to a focal track of a rotating target, the rotating target configured to rotate around an axis along a direction;
• deflecting the electron beam onto a first region of the focal track at a first time;
• deflecting the electron beam onto a second region of the focal track at a second time, wherein the first region of the focal track is separated from the second region of the focal track;
• and
• generating X-rays in response to the electron beam deflected onto the first region of the focal track or onto the second region of the focal track, wherein a distance between the first region of the focal track and the second region of the focal track along the direction is a half integer multiple of a dimension of a detector cell that is configured to detect the X-rays.

An imaging system, comprising:

• a gantry having a scanning hole extending along a direction;
• an X-ray tube located on the gantry, the X-ray tube including:
• a cathode configured to generate an electron beam;
• an anode including a rotating target, the rotating target having a focal track and configured to rotate around an axis along the direction, the anode configured to generate X-rays in response to the electron beam impinging on the focal track of the rotating target;
• and
• a deflection device configured to deflect the electron beam onto one or more regions of the focal track along the direction, wherein the first region of the focal track is separated from the second region of the focal track, and a distance between two of the one or more regions of the focal track along the direction is a half integer multiple of a dimension of a detector cell that is configured to detect the X-rays.