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US 10,455,171 B2Granted
Methods and apparatus for anti-eclipse circuit verification
AssigneeSemiconductor Components Industries, LLC
InventorRichard Scott Johnson
Life of this patent
Estimating the term…
Abstract
Various embodiments of the present technology may comprise a method and apparatus for anti-eclipse circuit verification. According to various embodiments, the image sensor is configured to test and/or determine the functionality of the anti-eclipse circuit. In various embodiments, the anti-eclipse circuit may employ redundant circuits and/or devices. In a case where a circuit fault is detected, the image sensor generates an error signal.
Claims14
An image sensor, comprising:
- a pixel array comprising a plurality pixels arranged in rows and columns;
- an anti-eclipse circuit connected to a column of pixels and comprising:
- a first transistor responsive to a first eclipse signal;
- and
- a first eclipse enable transistor;
- a verification circuit connected to the anti-eclipse circuit and configured to:
- control a voltage level of the first eclipse signal;
- and
- detect a failure in the anti-eclipse circuit comprising:
- generate a first test output signal;
- generate a second test output signal;
- generate a difference signal based on the first test output signal and the second output signal;
- and
- determine if the difference signal varies beyond a predetermined range.
11 more elements
A method for detecting circuit failures in an anti-eclipse circuit, comprising:
- providing an image sensor comprising the anti-eclipse circuit, wherein the image sensor is configured to:
- evaluate circuit connectivity of at least one circuit path from a plurality of circuit paths in the anti-eclipse circuit comprising:
- applying a first test signal to the anti-eclipse circuit at a first time;
- reading out a first test output signal at a second time;
- applying a second test signal to the anti-eclipse circuit at a third time;
- reading out a second test output signal at a fourth time;
- determining a difference signal between the first and second test output signals after the fourth time;
- and
- determining if the difference signal is within a predetermined voltage range;
- and
- generate an output signal according to the circuit connectivity evaluation.
8 more elements
An imaging system, comprising:
- a pixel array;
- an anti-eclipse circuit connected to the pixel array,
- wherein the anti-eclipse circuit comprises:
- a first transistor responsive to a first test input signal;
- a first eclipse enable transistor responsive to an eclipse enable signal;
- and a second transistor responsive to a second test input signal;
- and
- a verification circuit connected to the anti-eclipse circuit and configured to evaluate circuit connectivity of a circuit path used to control the anti-eclipse circuit, wherein evaluating circuit connectivity comprises:
- applying a first voltage to the first transistor at a first time;
- reading out a first test output voltage at a second time;
- applying a second voltage to the first transistor at a third time;
- reading out a second test output voltage at a fourth time;
- and
- determining a difference voltage between the first and second test output voltages.
11 more elements
Dependencies are inferred from the claim text.