Judging method of array test reliability, testing method and device of organic light emitting backplane

A judging method of array test reliability of an organic light emitting backplane, the organic light emitting backplane comprising a pixel circuit layer and an anode layer, the anode layer comprising an anode in each pixel of the organic light emitting backplane, the judging method of array test reliability comprising;

• Step 1, taking at least one of organic light emitting backplanes subjected to an array test as a sample substrate;
• Step 2, performing a scan on pixels of the sample substrate row by row and providing a data voltage signal;
• Step 3, detecting a current that is output to the anode of each pixel from the pixel circuit layer;
• Step 4, comparing the current that is output to the anode of each pixel from the pixel circuit layer with a predefined current, and judging that a pixel is a defective pixel when the current that is output to the anode of the pixel from the pixel circuit layer is inconsistent with the predefined current;
• and
• Step 5, comparing a judgment result of each pixel with a test result of the array test, judging that the array test is reliable when the judgment result is consistent with the test result, and judging that the array test is unreliable when the judgment result is inconsistent with the test result, the judging method of array test reliability further comprising a step to be performed between the Step 1 and the Step 2:
• Step 1.5, electrically connecting the anodes in a plurality of pixels, wherein, the Step 3 comprises:
• detecting a corresponding anode current every time when one row of pixels are scanned;
• the Step 4 comprises:
• Sub-step 4-1, comparing a detected anode current with the predefined current, judging that there is no defective pixel in the row of pixels corresponding to the detected anode current when the detected anode current is consistent with the predefined current, and judging that there is at least one defective pixel in the row of pixels corresponding to the detected anode current when the detected anode current is inconsistent with the predefined current;
• Sub-step 4-2, providing a scanning signal to the row of pixels having the defective pixel, and providing a data voltage signal sequentially to each pixel;
• Sub-step 4-3, detecting an anode current corresponding to each pixel;
• and
• Sub-step 4-4, comparing each anode current with the predefined current, and judging that a pixel corresponding to an anode current among the row of pixels having defective pixel is the defective pixel when the anode current is inconsistent with the predefined current.