Scan cell selection for partial scan designs
AssigneeMentor Graphics Corporation
InventorsXijiang Lin, Ting-Pu Tai, Wu-Tung Cheng, Takeo Kobayashi
Life of this patent
Estimating the term…
Loading patent…
AssigneeMentor Graphics Corporation
InventorsXijiang Lin, Ting-Pu Tai, Wu-Tung Cheng, Takeo Kobayashi
Estimating the term…
Various aspects of the disclosed technology relate to techniques of selecting scan cells from state elements for partial scan designs. Signal probability values for logic gates in a circuit design are first determined. Based on the signal probability values, next-state capture probability values for state elements in the circuit design are computed. Based on the next-state capture probability values, scan cells are selected from the state elements. Scan cells may be further selected based on continuously-updated control weight values and observation weight values associated with the state elements.
A method of selecting state elements in a circuit design for conversion into scan cells, executed by at least one processor of a computer, comprising:
One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method of weight-based determination of state elements to be converted into scan cells in a partial scan design, the method comprising:
A computerized system for designing partial scan circuits, comprising:
Dependencies are inferred from the claim text.