Electronic device monitoring using induced electromagnetic emissions from software stress techniques

A system comprising:

• a powered electronic device;
• an electromagnetic probe located close enough to the powered electronic device to collect spurious electromagnetic signals from the powered electronic device, wherein the electromagnetic probe is separated from the powered electronic device by an air gap, and wherein the spurious electromagnetic signals are unintended emissions inherent to powered electronic components;
• a computer, communicatively coupled to the electromagnetic probe, wherein the computer comprises a memory store having an emission profile of the powered electronic device stored therein, wherein the emission profile represents the spurious electromagnetic emissions behavior of the powered electronic device under a variety of controlled conditions, wherein the computer is configured via computer-implemented programming code stored therein to monitor spurious electromagnetic emissions of the powered electronic device in an operational environment and compare the spurious electromagnetic emissions of the powered electronic device in the operational environment with the emission profile of the powered electronic device and further configured to trigger an alert when the computer determines based on the comparison that the powered electronic device is operating under stress in the operational environment due to an attack on the powered electronic device.