Method and device for generating test patterns and selecting optimized test patterns among the test patterns in order to verify integrity of convolution operations to enhance fault tolerance and fluctuation robustness in extreme situations

A computing device for generating one or more test patterns and selecting one or more optimized test patterns among the test patterns in order to verify an integrity of one or more convolution operations, comprising:

• at least one memory that stores instructions;
• and
• at least one processor configured to execute the instructions to perform processes of:
• (I) instructing at least one pattern generating unit to generate the test patterns by using a certain function such that saturation does not occur while at least one original Convolution Neural Network (CNN) applies the convolution operations to the test patterns inputted thereto, (II) instructing at least one pattern evaluation unit to generate each of evaluation scores of each of the test patterns by referring to said each of the test patterns and one or more parameters of the original CNN, and (III) instructing at least one pattern selection unit to select the optimized test patterns among the test patterns by referring to the evaluation scores.