Storage device, test system for testing the same, and method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorKyuYeul Wang
Life of this patent
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Abstract
Embodiments include a method of a test system that comprises a host device and at least one storage device having multiple ports connected to the host device through a multi-port connection, the method comprising: issuing, by a test program at the host device, a first command; generating, by a device driver at the host device, a plurality of second commands in response to the first command; and simultaneously transferring, by the host device, the second commands to each of the at least one storage device.
Claims17
A method of operating a test system that comprises a host device and at least one storage device having multiple ports connected to the host device through a multi-port connection, the method comprising:
- issuing, by a test program at the host device, a first command, wherein the first command comprises an operation code, a first address, a flag indicating a dual port operation, and a second address;
- generating, by a device driver at the host device, a plurality of second commands from the first command;
- and
- simultaneously transferring, by the host device, the second commands to each of the at least one storage device.
A storage device comprising:
- a first port;
- a second port;
- at least one nonvolatile memory device;
- a first memory controller connected to the first port and configured to control at least a first part of the at least one nonvolatile memory device;
- a second memory controller connected to the second port and configured to control at least a second part of the at least one nonvolatile memory device;
- and
- a connector having the first port and the second port,
- wherein the connector includes a first side surface on which signal pins corresponding to the first port are arranged and a second side surface that is opposite to the first surface and on which signal pins corresponding to the second port are arranged, and
- wherein during a test operation:
- the first memory controller is configured to receive a first command through the first port and control the at least the first part of the at least one nonvolatile memory device in response to the first command;
- and
- the second memory controller is configured to receive a second command through the second port simultaneously with the first memory controller receiving the first command and control the at least the second part of the at least one nonvolatile memory device in response to the second command.
A test system comprising:
- a host device;
- and
- a plurality of devices under test (DUTs), each of which is connected to the host device through a multi-port connection,
- wherein the host device comprises:
- a central processing unit;
- and
- a host bus adapter connecting the central processing unit and the DUTs,
- wherein during a test operation, the host device is configured to transfer simultaneously a first command and a second command to a first port of each of the DUTs and a second port of each of the DUTs, respectively, and
- wherein a software architecture of the host device comprises an application layer configured to issue a multi-port command and a command layer configured to generate the first and second commands to be transferred to the DUTs from the multi-port command.
Dependencies are inferred from the claim text.