Minimization of over-masking in an on product multiple input signature register (OPMISR)
AssigneeInternational Business Machines Corporation
InventorsSteven M. Douskey, Mary P. Kusko, Matthew B. Schallhorn
Life of this patent
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AssigneeInternational Business Machines Corporation
InventorsSteven M. Douskey, Mary P. Kusko, Matthew B. Schallhorn
Estimating the term…
A method and test circuit are provided for implementing enhanced scan data testing with minimization of over masking in an on product multiple input signature register (OPMISR) test, and a design structure on which the subject circuit resides. Common Channel Mask Scan Registers (CMSR) data is used with a multiple input signature register (MISR) in each satellite. A test algorithm control is used for implementing enhanced scan data testing by independently skewing scan unload shifting of selected OPMISR+ satellite by selected cycles. With this modified shifting, for the same test or a repeated run of the test, Channel Mask Enable (CME) triggered masking lines up on a different bit position in channels of each satellite avoiding over masking.
A method for implementing enhanced scan data testing with over masking minimization in an on product multiple input signature register (OPMISR) comprising:
A test circuit for implementing enhanced scan data testing with over masking minimization in an on product multiple input signature register (OPMISR) comprising:
Dependencies are inferred from the claim text.