Removal of over-masking in an on product multiple input signature register (OPMISR) test

A method for implementing enhanced scan data testing with over masking removal in an on product multiple input signature register (OPMISR) comprising:

• providing a plurality of OPMISR satellites, each of the plurality of OPMISR satellites including a multiple input signature register (MISR) for data collection and a plurality of associated scan channels;
• providing common Channel Mask Scan Registers (CMSR) data and common Channel Mask Enable (CME) pins with the multiple input signature register (MISR) in each OPMISR satellite;
• providing a select signal in each OPMISR satellite, where said select signal controls advancing the scan unload into the MISR;
• using an algorithm for implementing enhanced scan data testing by selectively pausing scan unload for each respective selected OPMISR satellite;
• and
• using said select signal in respective satellite channels to selectively pause the scan unload for the respective OPMISR satellite when wrong CME data for the respective OPMISR satellite is at the CME pins for avoiding over masking.