Characterization of phase shifter circuitry in integrated circuits (ICs) using standard automated test equipment (ATE)

A method of characterizing a phase shifter in a receiver device under test (DUT) using automated test equipment, the method comprising:

• setting an ATE signal generator power level and frequency to transmit an input signal to the receiver DUT;
• down converting the input signal received to an intermediate frequency;
• routing the down converted input signal to a signal processor, wherein the signal processor generates I and Q signals using the input signal;
• setting at least one phase state bit to control the phase shifter to cycle through a plurality of phase states, wherein changing phase states appear on the I and Q signals;
• and
• characterizing the phase shifter, wherein the characterizing comprises processing the I and Q signals to extract individual phase states programmed by the at least one phase state bit.

An Automated Test Equipment (ATE) system, the system comprising:

• a non-transitory memory comprising instructions stored therein, wherein the instructions are operable to characterize a phase shifter in a transmitter device under test (DUT);
• a processor coupled to the memory, the processor configured to operate in accordance with the instructions to:
• down convert an input signal received from the transmitter DUT to an intermediate frequency;
• route the down converted input signal to a signal processor, wherein the signal processor generates I and Q signals using the input signal;
• set an initial phase state on the phase shifter in the transmitter DUT;
• toggle at least one phase state bit to control the phase shifter to cycle through a plurality of phase states, wherein changing phase states appear on the I and Q signals;
• and
• characterize the phase shifter by processing the I and Q signals to extract individual phase states programmed by the at least one phase state bit.

An Automated Test Equipment (ATE) system, the system comprising:

• a non-transitory memory comprising instructions stored therein, wherein the instructions are operable to characterize a phase shifter in a receiver device under test (DUT);
• a processor coupled to the memory, the processor configured to operate in accordance with the instructions to:
• set an ATE signal generator power level and frequency to transmit an input signal to the receiver DUT;
• down convert an input signal an intermediate frequency;
• route the down converted input signal to a signal processor, wherein the signal processor generates I and Q signals using the input signal;
• set at least one phase state bit to control the phase shifter to cycle through a plurality of phase states, wherein changing phase states appear on the I and Q signals;
• and
• characterize the phase shifter by processing the I and Q signals to extract individual phase states programmed by the at least one phase state bit.