Cold source based noise figure measurement using S-parameters and a vector signal transceiver/vector signal analyzer/spectrum analyzer

A measurement system comprising:

• a measurement instrument configured to couple to a device under test (DUT);
• and
• a processing unit configured to interoperate with the measurement instrument to:
• measure a first noise power when the DUT is not connected to the measurement instrument;
• determine a noise figure and noise temperature of the measurement instrument based at least on the measured first noise power and a first signal flow model representative of a signal measurement path exclusive of the DUT;
• measure a second noise power when the DUT is connected to the the measurement instrument;
• and
• determine a noise figure of the DUT based at least on the measured second noise power, the noise figure and noise temperature of the measurement instrument and a second signal flow model representative of the signal measurement path inclusive of the DUT.

A measurement system for measuring a noise factor of a device under test (DUT), the measurement system comprising:

• a non transitory memory element storing data;
• and
• a processing unit configured to use at least a portion of the data to interoperate with a measurement instrument to:
• measure a first noise power when the DUT is not connected to the measurement instrument;
• determine a noise figure and noise temperature of the measurement instrument based at least on the measured first noise power and a first signal flow model representative of a signal measurement path exclusive of the DUT;
• measure a second noise power when the DUT is connected to the measurement instrument;
• and
• determine a noise figure of the DUT based at least on the measured second noise power, the noise figure and noise temperature of the measurement instrument and a second signal flow model representative of the signal measurement path inclusive of the DUT.