Radiation phase change detection method and radiation imaging apparatus

A radiation phase change detection method for detecting a phase change of a radiation, the radiation phase change detection method comprising:

• arranging a two-dimensional optical image pickup element, which includes a scintillator, so that, when a period of a self-image generated through a phase grating is defined as D1, and a pixel pitch of the two-dimensional optical image pickup element is defined as D2=k*D1, k falls in a range of ½<k≤3/2, and so that interference fringes formed by D1 and D2 depending on a relationship in arrangement of the two-dimensional optical image pickup element with respect to the self-image have a period of 2 times D2 or more and 100 times D2 or less;
• acquiring a phase change of the interference fringes before and after insertion of an object;
• and
• outputting an image on a phase change of the radiation caused by at least the insertion of the object.

A radiation imaging apparatus, comprising:

• a radiation source;
• a phase grating configured to cause interference in a radiation radiated by the radiation source;
• a scintillator configured to convert the radiation into light;
• and
• a two-dimensional optical image pickup element,
• wherein the two-dimensional optical image pickup element is incapable of sampling a period of a self-image of the radiation generated through the phase grating, and is capable of sampling interference fringes generated between the period of the self-image and a period of a pixel pitch of the two-dimensional optical image pickup element.

A radiation imaging apparatus, comprising:

• a radiation source;
• a phase grating;
• a scintillator;
• and
• a two-dimensional optical image pickup element,
• wherein the radiation imaging apparatus is configured to detect a phase change of a radiation by:
• arranging the two-dimensional optical image pickup element so that, when a period of a self-image generated through the phase grating is defined as D1, and a pixel pitch of the two-dimensional optical image pickup element, which includes the scintillator, is defined as D2=k*D1, k falls in a range of ½<k≤3/2, and so that interference fringes formed depending on a relationship in arrangement of the two-dimensional optical image pickup element with respect to the self-image have a period of 2 times D2 or more and 100 times D2 or less;
• acquiring a phase change of the interference fringes before and after insertion of an object;
• and
• outputting an image on a phase change of the radiation caused by at least the object.