Data correction method in fine particle measuring device and fine particle measuring device

A fine particle measurement device comprising:

• a light illumination unit configured to emit light onto a fine particle flowing through a channel;
• a light detection unit configured to detect light generated from the fine particle;
• a position detection unit configured to obtain position information about the fine particle relative to a central position within the channel at a point when the fine particle passes through the emitted light, by forming an image pattern divided into a plurality of light reception areas such that the image pattern changes according to a flow position of the fine particle within the channel at the point when the fine particle passes through the emitted light, wherein the position information about the fine particle is obtained in a Z axis direction as the position information, and the Z axis direction is perpendicular to an X axis direction which is an emission direction of light onto the fine particle and a Y axis direction which is a flow direction of the fine particle;
• and
• an arithmetic computation unit configured to correct, on the basis of the position information, intensity information about light generated from the fine particle obtained by the light detection unit.