Apparatus for measuring spectral hemispherical reflectance of samples at grazing angles
AssigneeThe Boeing Company
InventorsMark D. Rogers, Loyal Bruce Shawgo, Jeffery Thomas Murphy
Life of this patent
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AssigneeThe Boeing Company
InventorsMark D. Rogers, Loyal Bruce Shawgo, Jeffery Thomas Murphy
Estimating the term…
Systems and methods are provided for measuring spectral hemispherical reflectance. One embodiment is a system that includes a laser that emits a beam of light, and an optical chopper disposed between the laser and a sample. The chopper blocks the beam while the chopper is at a first angle of rotation, redirects the beam along a reference path while the chopper is at a second angle of rotation, and permits the beam to follow a sample path through the chopper and strike the sample while the chopper is at a third angle of rotation. The system also includes a hollow sphere that defines a slot through which the sample path and reference path enter the sphere. The hollow sphere includes a spectral hemispherical reflectance detector, a mount that receives the sample at the sphere, and an actuator that rotates the sphere about an axis that intersects the sample.
A system comprising:
A method comprising:
A non-transitory computer readable medium embodying programmed instructions which, when executed by a processor, are operable for performing a method comprising:
Dependencies are inferred from the claim text.