Systems and methods for estimating temperatures of wires in an integrated circuit chip
AssigneeAnsys, Inc.
InventorsHsiming Stephen Pan, Norman Chang
Life of this patent
Estimating the term…
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AssigneeAnsys, Inc.
InventorsHsiming Stephen Pan, Norman Chang
Estimating the term…
Systems and methods are provided for estimating a temperature of a wire of an integrated circuit (IC) chip having a plurality of heat-generating components. For each of the heat-generating components, a temperature of the heat-generating component is computed. For each of the heat-generating components, a decay profile defining a thermal coupling from the heat-generating component to wires of the IC chip is computed. For each of the heat-generating components, a temperature elevation on the wire caused by the heat-generating component is computed. The temperature elevation is computed based on the temperature and decay profile of the heat-generating component and a spatial relationship between the wire and the heat-generating component. A total temperature elevation on the wire is computed by summing the temperature elevation of each of the heat-generating components. The heat-generating components include a plurality of wires of the IC chip and at least one device of the IC chip.
A computer-implemented method of estimating a temperature of a wire i of an integrated circuit (IC) chip having a plurality of heat-generating components, the method comprising:
A system for estimating a temperature of a wire i of an integrated circuit (IC) chip having a plurality of heat-generating components, the system comprising:
A non-transitory computer-readable storage medium for estimating a temperature of a wire i of an integrated circuit (IC) chip having a plurality of heat-generating components, the computer-readable storage medium comprising computer-executable instructions which, when executed, cause a processing system to execute steps comprising:
Dependencies are inferred from the claim text.