Structure status determination device, status determination system, and status determination method
AssigneeNEC Corporation
InventorHiroshi Imai
Life of this patent
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AssigneeNEC Corporation
InventorHiroshi Imai
Estimating the term…
The purpose of the present invention is to accurately detect, from a remote location without contact, a structure's defects such as cracking, separation, and internal cavities by distinguishing therebetween. The status determination device includes: a displacement calculation unit that, from time-series images of a structure surface before and after loading application, calculates a two-dimensional spatial distribution of a displacement of the time-series images; a depth moving amount calculation unit that calculates a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images; a displacement separation unit that calculates a correction amount based on the moving amount, and separates a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and an abnormality determination unit that identifies a defect of the structure, based on comparison of the two-dimensional spatial distribution of the displacement of the structure surface and the moving amount, with a spatial distribution of a displacement having been prepared in advance and a threshold value for the moving amount.
A status determination device comprising:
A status determination method comprising:
A status determination device comprising:
Dependencies are inferred from the claim text.