Optical security component with reflective effect, production of such a component and secure document provided with such a component
AssigneeSurys
InventorsValéry Petiton, Vincent Tollet
Life of this patent
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AssigneeSurys
InventorsValéry Petiton, Vincent Tollet
Estimating the term…
According to one aspect, the invention relates to an optical security component intended for being observed under direct reflection. The component comprises a structure engraved on a layer of a material having a refraction index n2, a thin layer of a dielectric material having a refraction index n1 other than n2, deposited on the structure, and a layer of a material having a refraction index no other than n1, encapsulating the coated structure of the thin layer. The structure has a first pattern modulated by a second pattern such that, in at least one first region (61, 86), the first pattern comprises a low-relief with a first set of facets, the shapes of which are determined such as to generate at least one first concave or convex cylindrical reflective element, and the second pattern forms a first subwavelength grating acting, after depositing the thin layer and encapsulating the structure, as a first wavelength-subtractive filter; in at least one second region (62, 86), the first pattern comprises a low-relief with a second set of facets in which the shapes are determined such as to generate at least one concave or convex cylindrical reflective element (64), and the second pattern forms a second subwavelength grating acting, after depositing the thin layer and encapsulating the structure, as a second wavelength-subtractive filter, separate from the first wave-length-subtractive filter. Each subwavelength grating can be a zero order diffraction grating such as a DID.
An optical security component intended to be observed according to an observation face in a spectral band lying between 380 and 780 nm and in direct reflection, comprising:
A method for manufacturing an optical security component intended to be observed in a spectral band lying between 380 and 780 nm and in direct reflection, the method comprising:
Dependencies are inferred from the claim text.