Pattern based estimation of errors in ADC
AssigneeTexas Instruments Incorporated
InventorsSrinivas Kumar Reddy Naru, Visvesvaraya Pentakota Appala, Shagun Dusad, Neeraj Shrivastava, Viswanathan Nagarajan, Ani Xavier, Rishi Soundararajan, Sai Aditya Nurani, Roswald Francis
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