Recessed switched test connector
AssigneeMicrosoft Technology Licensing, LLC
InventorsChen Zhang, Toby Morris
Life of this patent
Estimating the term…
Abstract
Circuit boards incorporating one or more wireless communication components are often subjected to certification testing during commissioning. A test port is often included within each circuit board to perform the certification testing. The presently disclosed recessed test connectors reduce or eliminate protrusion of the test port on a non-component side of the circuit board, while still providing access to the test port from the non-component side of the circuit board.
Claims19
A printed circuit board comprising:
- a substrate including an aperture;
- an array of components attached to a first side of the substrate;
- and
- a recessed switched test connector oriented within the aperture, wherein the recessed switched test connector includes:
- a test port accessible from a second side of the substrate;
- a bracket securing the recessed switched test connector within the aperture;
- and
- a contact to elastically deflect and electrically open an electrical path through the printed circuit board when an associated test probe is inserted into the test port.
A method of using a recessed switched test connector in a printed circuit board comprising:
- inserting a test probe into a test port of the recessed switched test connector, the recessed switched test connector oriented within an aperture in a substrate, and the recessed switched test connector accessible from a side of the substrate opposite an array of components attached to the substrate, whereby a contact elastically deflects and electrically opens when the test probe is inserted into the test port;
- and
- certification testing an electrical circuit connected from the recessed switched test connector to the test probe.
A computing device comprising:
- a printed circuit board including:
- a substrate including an aperture;
- an array of components attached to a first side of the substrate;
- a recessed switched test connector oriented within the aperture, wherein the recessed switched test connector includes:
- a test port accessible from a second side of the substrate;
- and
- a bracket securing the recessed switched test connector within the aperture;
- a display residing in close proximity to the first side of the substrate;
- and
- a case residing in close proximity to the second side of the substrate, wherein the case includes a test aperture axially aligned with the test port permitting access to the test port from outside the computing device.
Dependencies are inferred from the claim text.