Semiconductor device
AssigneeMurata Manufacturing Co., Ltd.
InventorsYuri Honda, Fumio Harima, Kazuhito Nakai
Life of this patent
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AssigneeMurata Manufacturing Co., Ltd.
InventorsYuri Honda, Fumio Harima, Kazuhito Nakai
Estimating the term…
Provided is a semiconductor device with a reduced variation in temperature among a plurality of unit transistors. A semiconductor device includes: a semiconductor substrate; and a transistor group including at least one column in which a plurality of unit transistors are aligned and arranged along a first axis on the semiconductor substrate. A first column of the at least one column includes: a first group of transistors including two of the unit transistors that are adjacent to each other with a first distance therebetween, and a second group of transistors including two of the unit transistors that are adjacent to each other with a second distance therebetween, the first group of transistors is disposed at a position closer to a center of the first column along the first axis than the second group of transistors, and the first distance is larger than the second distance.
A semiconductor device, comprising:
Dependencies are inferred from the claim text.