Diffusion barrier layer formation
AssigneeInternational Business Machines Corporation
InventorsBrett H. Engel, Domingo A. Ferrer, Arun Vijayakumar, Keith Kwong Hon Wong
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AssigneeInternational Business Machines Corporation
InventorsBrett H. Engel, Domingo A. Ferrer, Arun Vijayakumar, Keith Kwong Hon Wong
Estimating the term…
A method of forming a titanium nitride (TiN) diffusion barrier includes exposing a deposition surface to a first pulse of a titanium-containing precursor and to a first pulse of a nitrogen-rich plasma to form a first TiN layer with a first nitrogen concentration making a lower portion of the TiN diffusion barrier, the first nitrogen concentration of the first TiN layer is increased by the first pulse of the nitrogen-rich plasma reducing a reactivity of the lower portion of the TiN diffusion barrier to prevent fluorine diffusion. The first TiN layer is exposed to second pulses of the titanium-containing precursor and the nitrogen-rich plasma to form a second TiN layer with a second nitrogen concentration above the first TiN layer making an upper portion of the TiN diffusion barrier, the first pulse of the nitrogen-rich plasma has a substantially longer duration than the second pulse of the nitrogen-rich plasma.
A method of forming a titanium nitride diffusion barrier, the method comprising:
Dependencies are inferred from the claim text.