Hardware apparatuses and methods to check data storage devices for transient faults
AssigneeIntel Corporation
InventorsAshok Raj, Ron Gabor, Hisham Shafi, Mohan J. Kumar, Theodros Yigzaw
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AssigneeIntel Corporation
InventorsAshok Raj, Ron Gabor, Hisham Shafi, Mohan J. Kumar, Theodros Yigzaw
Estimating the term…
Methods and apparatuses relating to a hardware memory test unit to check a section of a data storage device for a transient fault before the data is stored in and/or loaded from the section of the data storage device are described. In one embodiment, an integrated circuit includes a hardware processor to operate on data in a section of a data storage device, and a memory test unit to check the section of the data storage device for a transient fault before the data is stored in the section of the data storage device, wherein the transient fault is to cause a machine check exception if accessed by the hardware processor.
A processor comprising:
A method comprising:
A non-transitory machine readable storage medium having code that, when executed, causes a machine to perform a method comprising:
Dependencies are inferred from the claim text.