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US 10,313,032 B2Granted
Test system and method for testing a device under test
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsCorbett Rowell, Hendrik Bartko, Adam Tankielun
Life of this patent
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Abstract
A test system for testing a device under test is described, which comprises an antenna array having a plurality of antenna elements and an adjustment unit having a Fresnel structure. The adjustment unit is placed between the antenna array and the device under test. Further, a method for testing a device under test is described.
Claims15
A test system for testing a device under test, comprising:
- an antenna array having a plurality of antenna elements;
- an adjustment unit having a Fresnel structure, said adjustment unit being placed between said antenna array and said device under test, said antenna array being a plane wave converter, said adjustment unit being placed in a near field of said antenna array;
- and
- a control unit connected with said adjustment unit for controlling said adjustment unit, the control unit controlling the position of the adjustment unit with respect to at least one of the antenna array and the device under test such that different field distributions are projected by the adjustment unit.
1 more element
A method for testing a device under test, with the following steps:
- providing an antenna array having a plurality of antenna elements, the antenna array being a plane wave converter;
- providing a device under test;
- providing an adjustment unit having a Fresnel structure;
- placing said adjustment unit between said antenna array and said device under test;
- and
- measuring at least one of the receiving and transmission properties of the device under test under far field conditions at different frequencies.
3 more elements
A test system for testing a device under test, comprising:
- an antenna array having a plurality of antenna elements, said antenna array being a plane wave converter;
- and
- an adjustment unit having a Fresnel structure, said adjustment unit being placed between said antenna array and said device under test, said adjustment unit being placed in the near field of said antenna array,
- wherein the test system is configured to measure at least one of the receiving and the transmission properties of the device under test under far field conditions at different frequencies.
1 more element
Dependencies are inferred from the claim text.