Method of manufacturing semiconductor device
AssigneeToyota Jidosha Kabushiki Kaisha
InventorsTakuya Kadoguchi, Naoya Take
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AssigneeToyota Jidosha Kabushiki Kaisha
InventorsTakuya Kadoguchi, Naoya Take
Estimating the term…
A method of manufacturing a semiconductor device which includes a first member and a second member joined to the first member includes: a) producing (Cu,Ni)6Sn5 on a Ni film formed on the first member by melting a first Sn—Cu solder containing 0.9 wt % or higher of Cu on the Ni film of the first member; b) producing (Cu,Ni)6Sn5 on a Ni film formed on the second member by melting a second Sn—Cu solder containing 0.9 wt % or higher of Cu on the Ni film of the second member; and c) joining the first member and the second member to each other by melting the first Sn—Cu solder having undergone step a) and the second Sn—Cu solder having undergone step b) so that the first Sn—Cu solder and the second Sn—Cu solder become integrated.
A method of manufacturing a semiconductor device which includes a first member and a second member joined to the first member, the method comprising:
A method of manufacturing a semiconductor device which includes a first member and a second member joined to the first member, the method comprising:
Dependencies are inferred from the claim text.