Method for compensating probe misplacement and probe apparatus
AssigneeMpi Corporation
InventorsChen-Ching Chen, Yu-Hsun Hsu, Po-Yi Ting, Stojan Kanev
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AssigneeMpi Corporation
InventorsChen-Ching Chen, Yu-Hsun Hsu, Po-Yi Ting, Stojan Kanev
Estimating the term…
A method for compensating probe misplacement and a probe apparatus are provided. The method is applicable to a probe module which includes a probe and a fixing base. The probe includes a probe body section and a probe tip section. The probe body section is fixed on the fixing base. The method includes: measuring a temperature of a probe body of the probe body section of the probe; calculating, according to the temperature of the probe body, thermal expansion amount of the probe along a length direction of the probe body section; calculating a compensation value according to the thermal expansion amount; moving the probe or a to-be-tested element according to the calculated compensation value, to align a probe tip of the probe tip section with the to-be-tested element or align the to-be-tested element with the probe tip of the probe tip section.
A method for compensating probe misplacement, applicable to a probe module, wherein the probe module comprises a probe and a fixing base, the probe comprises a probe body section and a probe tip section, and the probe body section is fixed on the fixing base, the method for compensating probe misplacement comprising:
A probe module, comprising:
A method for compensating probe misplacement, applicable to a probe module, wherein the probe module comprises a probe and a fixing base, the probe comprises a probe body section and a probe tip section, and the probe body section is fixed on the fixing base, the method for compensating probe misplacement comprising:
Dependencies are inferred from the claim text.