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US 10,311,959 B2Granted
Voltage degradation aware NAND array management
AssigneeMicron Technology, Inc.
InventorsSebastien Andre Jean, Harish Reddy Singidi
Life of this patent
Estimating the term…
Abstract
Devices and techniques for voltage degradation aware NAND array management are disclosed herein. Voltage to a NAND device is monitored to detect a voltage event. A history of voltage events is modified with the voltage event. A voltage condition is observed from the history of voltage events. An operational parameter of a NAND array in the NAND device is then modified in response to the voltage condition.
Claims22
A memory device for voltage degradation aware memory array management, the memory device comprising:
- a memory array;
- and
- a controller to:
- detect a variation of a supply voltage to the memory array, the variation determined to be at least one of a threshold drop in supply voltage from an expected supply voltage or a difference in supply voltage between measurements of the supply voltage;
- record the variation of the supply voltage with other detected variations of the supply voltage to create a voltage event history, the voltage event history being a data structure managed by a controller of the memory device;
- and
- change operation of the memory array in response to a metric of voltage variations derived from the voltage event history, the metric of voltage variations measuring a deviation of the supply voltage from a supply voltage for reliable memory array write operations.
4 more elements
A method for voltage degradation aware memory array management, the memory device comprising:
- detecting a variation of a supply voltage to a memory array of a memory device, the variation determined to be at least one of a threshold drop in supply voltage from an expected supply voltage or a difference in supply voltage between measurements of the supply voltage;
- recording the variation of the supply voltage with other detected variations of the supply voltage to create a voltage event history, the voltage event history being a data structure managed by a controller of the memory device;
- and
- changing operation of the memory array in response to a metric of voltage variations derived from the voltage event history, the metric of voltage variations measuring a deviation of the supply voltage from a supply voltage for reliable memory array write operations.
1 more element
Dependencies are inferred from the claim text.