Input circuit of three-dimensional semiconductor apparatus capable of enabling testing and direct access

An input circuit of a semiconductor apparatus, comprising:

• a first input buffer configured to receive a first signal through a test input terminal and to output a first input signal;
• a second input buffer configured to receive a second signal through a normal input terminal and to output a second input signal;
• a switching unit configured to transfer the first signal inputted through the test input terminal to the second input buffer according to a test mode signal;
• a comparison unit configured to compare the first input signal with the second input signal and to generate a comparison signal;
• and
• a storage unit configured to store the comparison signal,
• wherein, the semiconductor apparatus includes a semiconductor memory module and a memory controller, and
• wherein the test input terminal includes a direct access ball (DAB) exposed to an exterior of the semiconductor apparatus to access the memory module directly,
• wherein a direct access mode circuit is configured to perform an operation related to a direct access mode according to the first input signal, and
• wherein a data, inputted from a test equipment through the DAB in order to directly test the memory module, is transferred to the direct access mode circuit through the first input buffer, so that a memory module test operation is performed by the direct access mode circuit.