Image inspection method, image inspection device, program, and image recording system
AssigneeFUJIFILM Corporation
InventorMasayuki Ukishima
Life of this patent
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AssigneeFUJIFILM Corporation
InventorMasayuki Ukishima
Estimating the term…
The image inspection method includes: a step of acquiring data of an inspection image obtained by capturing an image of a recorded matter recorded by an image recording system that performs a compensation process of compensating for a defect caused by a failure in an image formation element, using an imaging apparatus; a step of acquiring data of a reference image; and a step of comparing the data of the inspection image with the data of the reference image to determine whether there is a defect at each position of the inspection image. The defect detection step includes a process that makes a defect detection performance different in a compensation application region and a compensation non-application region other than the compensation application region, on the basis of compensation position information of the failure in the image formation element to which the compensation process has been applied.
An image inspection method comprising:
An image inspection device comprising:
An image recording system comprising:
A non-transitory computer-readable tangible recording medium including a program that causes a computer to perform:
Dependencies are inferred from the claim text.