Dynamic embedded integrated circuit in trackable item

An article of manufacture comprising a processor-readable storage medium having encoded therein executable code of one or more software programs, wherein the one or more software programs when executed by at least one processor implement the steps of:

• maintaining a database comprising first scan history data associated with a given integrated circuit associated with a given item;
• receiving second scan history data associated with the given integrated circuit;
• determining an authenticity of the given item based on a comparison of the first scan history data to the second scan history data;
• wherein the second scan history data is stored in the given integrated circuit each time the given integrated circuit is scanned;
• wherein the second scan history data comprises at least current scan data associated with a current scan of the given integrated circuit, and wherein the first scan history data comprises prior scan data associated with at least a scan of the given integrated circuit performed prior to the current scan;
• wherein determining the authenticity of the given item comprises comparing the prior scan data to the current scan data;
• and
• wherein the prior scan data and the current scan data comprise respective indications of a location of where the prior scan and the current scan were each performed.

An apparatus comprising:

• at least one computer processor coupled to a memory and configured to:
• maintain a database comprising first scan history data associated with a given integrated circuit associated with a given item;
• receive second scan history data associated with the given integrated circuit;
• determine an authenticity of the given item based on a comparison of the first scan history data to the second scan history data;
• wherein the second scan history data is stored in the given integrated circuit each time the given integrated circuit is scanned;
• wherein the second scan history data comprises at least current scan data associated with a current scan of the given integrated circuit, and wherein the first scan history data comprises prior scan data associated with at least a scan of the given integrated circuit performed prior to the current scan;
• wherein determining the authenticity of the given item comprises comparing the prior scan data to the current scan data;
• and
• wherein the prior scan data and the current scan data comprise respective indications of a location of where the prior scan and the current scan were each performed.