Overlay design optimization
AssigneeNova Measuring Instruments Ltd.
InventorsGilad Barak, Tal Verdene, Michal Yachini, Dror Shafir, Changman Moon, Shay Wolfling
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Abstract
A sample comprising an overlay target is presented. The overlay target comprises at least one pair of patterned structures, the patterned structures of the pair being accommodated in respectively bottom and top layers of the sample with a certain vertical distance h between them, wherein a pattern in at least one of the patterned structures has at least one pattern parameter optimized for a predetermined optical overlay measurement scheme with a predetermined wavelength range.
Claims13
A sample comprising an overlay target comprising at least one pair of patterned structures, the patterned structures of the pair being top and bottom patterned structures arranged in respectively a top layer of the sample and one of underneath layers of the sample with a certain vertical distance h between them, wherein a pattern in at least one of the patterned structures is configured as a global pattern Gglob formed by spaced-apart global features arranged with a pitch P approximately equal to said vertical distance h, wherein each of the global features of the global pattern is configured as a building block of a local pattern Gloc of spaced-apart local features arranged with a predefined pitch value P′, at least one pattern parameter of said at least one of the patterned structures being optimized for a predetermined optical overlay measurement scheme with a predetermined wavelength range.
A semiconductor wafer structure comprising an overlay target comprising at least one pair of patterned structures, the patterned structures of the pair being top and bottom patterned structures arranged in respectively a top layer of the wafer structure and one of underneath layers of the wafer structure with a certain vertical distance h between them, wherein a pattern in at least one of the patterned structures is configured as a global pattern Gglob formed by spaced-apart global features arranged with a pitch P approximately equal to said vertical distance h, wherein each of the global features of the global pattern is configured as a local pattern Gloc of spaced-apart local features arranged with a predefined pitch value P′, at least a value of said pitch P of the global pattern Gglob being selected for a predetermined optical overlay measurement scheme, requiring to maintain said predefined pitch value P′.
A sample comprising an overlay target comprising at least one pair of patterned structures, the patterned structures of the pair being top and bottom patterned structures arranged in respectively a top layer of the sample and one of underneath layers of the sample with a certain vertical distance h between them, wherein at least one of the patterned structures of the pair comprises a first global pattern in the form of spaced-apart global features of the first global pattern which are arranged with a pitch P approximately equal to said vertical distance h and each of said global features of the global pattern is configured as a building block of a second local pattern of spaced-apart local features arranged with a predefined pitch value P′.
Dependencies are inferred from the claim text.