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US 10,311,163 B2Granted
Non-parametric microfacet factor models for isotropic bidirectional reflectance distribution functions
AssigneeMicrosoft Technology Licensing, LLC
InventorsMahdi MohammadBagher, Derek Nowrouzezahrai, John Michael Snyder
Life of this patent
Estimating the term…
Abstract
A plurality of measured sample data points associated with reflectance on a surface of a material is obtained. A non-parametric densely tabulated one-dimensional representation for a plurality of factors in a microfacet model is generated, using the obtained sample data points.
Claims20
A system comprising:
- at least one processor;
- and
- a computer-readable storage medium that stores executable code which, when executed by the at least one processor, causes the at least one processor to:
- obtain measured three-dimensional (3D) sample data associated with reflectance on a surface of an isotropic material;
- fit the 3D sample data to a microfacet model comprising one-dimensional (1D) functions that are factors in the microfacet model by iteratively updating an individual factor while holding the remaining factors constant to generate a non-parametric densely tabulated 1D representation of the reflectance;
- and
- render one or more images using the non-parametric densely tabulated 1D representation.
4 more elements
A computer-implemented method comprising:
- obtaining measured three-dimensional (3D) sample data associated with reflectance on a surface of an isotropic material;
- fitting the measured 3D sample data to a model that includes one-dimensional (1D) functions to generate a 1D representation of the model, the fitting including applying a model fitting metric to the measured 3D sample data, the model fitting metric calculated using a nonnegative, nonzero power of a ratio of a compressive function and a non-asymptotically increasing function, the compressive function and the non-asymptotically increasing function defined over normalized values of the measured 3D sample data;
- and
- rendering one or more images based at least on the 1D representation of the model.
1 more element
A system comprising:
- at least one data processing apparatus;
- and
- a computer-readable storage medium storing executable code which, when executed by the at least one data processing apparatus, causes the at least one data processing apparatus to:
- obtain measured three dimensional (3D) sample data associated with reflectance on a surface of an isotropic material;
- fit the measured 3D sample data to a model that includes 1D functions to generate a one-dimensional (1D) representation of the model by applying a fitting metric to the measured 3D sample data, the fitting metric calculated using a sum-of-squares weighting, the sum-of-squares weighting including a non-constant function of measurement magnitudes of the measured 3D sample data;
- and
- render one or more images using the 1D representation.
4 more elements
Dependencies are inferred from the claim text.